: Transmission electron microscopes (TEM)Electron microscopes generate images of material microstructures with much higher magnification and resolution than light microscopes. The high resolution of electron microscopes results from the short wavelengths of the electrons used for microscope illumination. The wavelength of electrons in electron microscopes is about 10,000 times shorter than that of visible light. The resolution of electron microscopes reaches the order of 0.1 nm if lens aberrations can be minimized. Such high resolution makes electron microscopes extremely useful for revealing ultra fine details of material microstructure. There are two main types of electron microscopes: transmission electron microscopes (TEM) and scanning electron microscopes (SEM). The optics of the TEM are similar to the conventional transmission light microscope, while that of SEM is more like that of scanning confocal laser microscopes.
A transmission electron microscope, similar to a transmission light microscope, has the following components along its optical path: light source, condenser lens, specimen stage, objective lens and projector lens as shown in Figure 1.
المادة المعروضة اعلاه هي مدخل الى المحاضرة المرفوعة بواسطة استاذ(ة) المادة . وقد تبدو لك غير متكاملة . حيث يضع استاذ المادة في بعض الاحيان فقط الجزء الاول من المحاضرة من اجل الاطلاع على ما ستقوم بتحميله لاحقا . في نظام التعليم الالكتروني نوفر هذه الخدمة لكي نبقيك على اطلاع حول محتوى الملف الذي ستقوم بتحميله .
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